INTERNATIONAL PATENT: AGC INC., ＡＧＣ株式会社 FILES APPLICATION FOR "METHOD FOR PRODUCING MAGNETIC PARTICLES, MAGNETIC PARTICLES AND PERMANENT MAGNET USING SAME"

Posted On: 2025-05-27

GENEVA, May 27 -- AGC INC. (5-1, Marunouchi 1-chome, Chiyoda-ku, Tokyo1008405), ＡＧＣ株式会社 (東京都千代田区&#2002... Read More

INTERNATIONAL PATENT: SUMITOMO ELECTRIC INDUSTRIES, LTD., 住友電気工業株式会社, AUTONETWORKS TECHNOLOGIES, LTD., 株式会社オートネットワーク技術研究所, SUMITOMO WIRING SYSTEMS, LTD., 住友電装株式会社, TOYOTA JIDOSHA KABUSHIKI KAISHA, トヨタ自動車株式会社 FILES APPLICATION FOR "IN-VEHICLE NETWORK MANAGEMENT SYSTEM AND IN-VEHICLE NETWORK MANAGEMENT METHOD"

Posted On: 2025-05-27

GENEVA, May 27 -- SUMITOMO ELECTRIC INDUSTRIES, LTD. (5-33, Kitahama 4-chome, Chuo-ku, Osaka-shi, Osaka5410041), 住友電気工業株式会社 (&#228... Read More

INTERNATIONAL PATENT: NUFLARE TECHNOLOGY, INC., 株式会社ニューフレアテクノロジー FILES APPLICATION FOR "MARK POSITION MEASURING DEVICE AND MARK POSITION MEASURING METHOD"

Posted On: 2025-05-27

Government News US Fed News

GENEVA, May 27 -- NUFLARE TECHNOLOGY, INC. (8-1, Shinsugita-cho, Isogo-ku, Yokohama-shi, Kanagawa2358522), 株式会社ニューフレアテ&#124... Read More

INTERNATIONAL PATENT: DENKA COMPANY LIMITED, デンカ株式会社 FILES APPLICATION FOR "THERMOPLASTIC RELEASE FILM FOR SEMICONDUCTOR SEALING PROCESS"

Posted On: 2025-05-27

Government News US Fed News

GENEVA, May 27 -- DENKA COMPANY LIMITED (1-1, Nihonbashi-Muromachi 2-chome, Chuo-ku, Tokyo1038338), デンカ株式会社 (東京都中央&#... Read More

INTERNATIONAL PATENT: SEMITEC CORPORATION, ＳＥＭＩＴＥＣ株式会社 FILES APPLICATION FOR "TEMPERATURE SENSOR AND DEVICE EQUIPPED WITH TEMPERATURE SENSOR"

Posted On: 2025-05-27

Government News US Fed News

GENEVA, May 27 -- SEMITEC CORPORATION (7-7, Kinshi 1-Chome, Sumida-ku Tokyo1308512), ＳＥＭＩＴＥＣ株式会社 (東京都&... Read More

INTERNATIONAL PATENT: JX ADVANCED METALS CORPORATION, ＪＸ金属株式会社 FILES APPLICATION FOR "SPUTTERING TARGET ASSEMBLY AND FILM"

Posted On: 2025-05-27

Government News US Fed News

GENEVA, May 27 -- JX ADVANCED METALS CORPORATION (10-4, Toranomon 2-chome, Minato-ku, Tokyo1058417), ＪＸ金属株式会社 (東京都港&... Read More

INTERNATIONAL PATENT: NEC CORPORATION, 日本電気株式会社 FILES APPLICATION FOR "WORK EVALUATION DEVICE, WORK EVALUATION METHOD AND PROGRAM"

Posted On: 2025-05-27

Government News US Fed News

GENEVA, May 27 -- NEC CORPORATION (7-1, Shiba 5-chome, Minato-ku, Tokyo1088001), 日本電気株式会社 (東京都港区芝&#201... Read More

INTERNATIONAL PATENT: SHIN-ETSU CHEMICAL CO., LTD., 信越化学工業株式会社, SHINSHU UNIVERSITY, 国立大学法人信州大学 FILES APPLICATION FOR "GEL COMPOSITION, MEMBER, ELECTRONIC ELEMENT, ELECTRONIC DEVICE AND METHOD FOR PRODUCING GEL COMPOSITION"

Posted On: 2025-05-27

Government News US Fed News

GENEVA, May 27 -- SHIN-ETSU CHEMICAL CO., LTD. (4-1, Marunouchi 1-chome, Chiyoda-ku, Tokyo1000005), 信越化学工業株式会社 (東京&#... Read More

INTERNATIONAL PATENT: LINTEC CORPORATION, リンテック株式会社, THE UNIVERSITY OF TOKYO, 国立大学法人東京大学 FILES APPLICATION FOR "MICRONEEDLE STRUCTURE AND METHOD FOR PRODUCING SAME"

Posted On: 2025-05-27

Government News US Fed News

GENEVA, May 27 -- LINTEC CORPORATION (23-23, Honcho, Itabashi-ku, Tokyo1730001), リンテック株式会社 (東京都板橋&#213... Read More

INTERNATIONAL PATENT: KABUSHIKI KAISHA TOSHIBA, 株式会社東芝, TOSHIBA INFRASTRUCTURE SYSTEMS & SOLUTIONS CORPORATION, 東芝インフラシステムズ株式会社 FILES APPLICATION FOR "MICROPARTICLE MEASURING SYSTEM AND MICROPARTICLE MEASURING METHOD"

Posted On: 2025-05-27

Government News US Fed News

GENEVA, May 27 -- KABUSHIKI KAISHA TOSHIBA (1-1, Shibaura 1-chome, Minato-ku, Tokyo1050023), 株式会社東芝 (東京都港区芝浦&... Read More

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INTERNATIONAL PATENT: AGC INC., ＡＧＣ株式会社 FILES APPLICATION FOR "METHOD FOR PRODUCING MAGNETIC PARTICLES, MAGNETIC PARTICLES AND PERMANENT MAGNET USING SAME"

INTERNATIONAL PATENT: NUFLARE TECHNOLOGY, INC., 株式会社ニューフレアテクノロジー FILES APPLICATION FOR "MARK POSITION MEASURING DEVICE AND MARK POSITION MEASURING METHOD"

INTERNATIONAL PATENT: DENKA COMPANY LIMITED, デンカ株式会社 FILES APPLICATION FOR "THERMOPLASTIC RELEASE FILM FOR SEMICONDUCTOR SEALING PROCESS"

INTERNATIONAL PATENT: SEMITEC CORPORATION, ＳＥＭＩＴＥＣ株式会社 FILES APPLICATION FOR "TEMPERATURE SENSOR AND DEVICE EQUIPPED WITH TEMPERATURE SENSOR"

INTERNATIONAL PATENT: JX ADVANCED METALS CORPORATION, ＪＸ金属株式会社 FILES APPLICATION FOR "SPUTTERING TARGET ASSEMBLY AND FILM"

INTERNATIONAL PATENT: NEC CORPORATION, 日本電気株式会社 FILES APPLICATION FOR "WORK EVALUATION DEVICE, WORK EVALUATION METHOD AND PROGRAM"

INTERNATIONAL PATENT: SHIN-ETSU CHEMICAL CO., LTD., 信越化学工業株式会社, SHINSHU UNIVERSITY, 国立大学法人信州大学 FILES APPLICATION FOR "GEL COMPOSITION, MEMBER, ELECTRONIC ELEMENT, ELECTRONIC DEVICE AND METHOD FOR PRODUCING GEL COMPOSITION"

INTERNATIONAL PATENT: LINTEC CORPORATION, リンテック株式会社, THE UNIVERSITY OF TOKYO, 国立大学法人東京大学 FILES APPLICATION FOR "MICRONEEDLE STRUCTURE AND METHOD FOR PRODUCING SAME"

INTERNATIONAL PATENT: KABUSHIKI KAISHA TOSHIBA, 株式会社東芝, TOSHIBA INFRASTRUCTURE SYSTEMS & SOLUTIONS CORPORATION, 東芝インフラシステムズ株式会社 FILES APPLICATION FOR "MICROPARTICLE MEASURING SYSTEM AND MICROPARTICLE MEASURING METHOD"